Equipments

Scanning Electron Microscope (SEM) – Hitachi TM4000Plus with Bruker EDS

Description

The Hitachi TM4000Plus is a benchtop scanning electron microscope (SEM) designed for high-resolution observation of surface morphology. It enables topographical and structural analysis of solid samples, with or without prior preparation.

This system is equipped with a Bruker energy-dispersive X-ray spectroscopy (EDS) module, allowing localized elemental chemical analysis with high precision. This feature makes it ideal for compositional characterization of materials.

With a backscattered electron (BSE) detector and partial vacuum capability, the TM4000Plus enables observation of non-conductive materials without the need for metal coating.

Key Applications:

  • Morphological and chemical characterization of metallic, ceramic, polymeric, and composite surfaces

  • Analysis of fractures, contamination, and inclusions in technical materials

  • Studies of particles, fibers, thin films, and coatings

  • Support for research projects, education, and quality control

Combining intuitive operation with advanced analytical capabilities, the TM4000Plus with Bruker EDS offers a comprehensive solution for microstructural and chemical analysis of materials.

 

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