Description
Micro‑area X‑ray diffraction (XRD) system with a 2‑axis goniometer, automatic mapping, and a D/teX Ultra1000 detector, enabling high‑accuracy measurement of large/heavy samples (up to 30 kg) using ISO tilt and side‑inclination methods, with safety enclosure and interlocks. The AutoMATE II is a residual‑stress measurement system based on X‑ray diffraction, combined with a 1D semiconductor detector (D/teX Ultra). The AutoMATE II includes a video‑microscopy system equipped with a zoom function to assist with sample alignment, and it can also be used for XY mapping and automatic continuous measurement when combined with the automatic XYZ stage (X and Y travel: 100 mm; Z travel: 40 mm). The X‑ray generator provides 2 kW output, with voltage adjustable from 20 to 50 kV in 1 kV steps and current adjustable from 2 to 50 mA in 1 mA steps.
Applications: crystalline materials such as ceramics and metals. It also supports quantitative measurement of retained austenite.
